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[Delivery Record] Measurement and Control Equipment - Standard Light Source Device for Image Sensor Inspection

A light source device used for performance testing (inspection) of semiconductors.

This is a light source device used for performance testing (inspection) of semiconductor image sensors such as CCD and CMOS types, area sensors, linear sensors, and near-infrared sensors. The light source device is used in conjunction with test systems for pre-manufacturing tests (electrical characteristic tests of wafers), post-manufacturing tests (electrical function tests of packages), and R&D evaluation tests. It is compatible with various test systems, supports 300mm wafers, is suitable for low illumination, and excels in color temperature management. 【Features】 ■ Light source device used for performance testing (inspection) of semiconductors → CCD and CMOS type image sensors, area sensors, linear sensors, near-infrared sensors, etc. ■ Used in connection with test system devices → Pre-manufacturing tests (electrical characteristic tests of wafers) → Post-manufacturing tests (electrical function tests of packages) → R&D evaluation tests, etc. *For more details, please refer to the PDF document or feel free to contact us.

• Company：応用電機 神奈川事業部（大和工場）
• Price：Other

• Other measurement, recording and measuring instruments
• Other inspection equipment and devices
• Semiconductor inspection/test equipment